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SDC-580 fully automatic wafer type contact angle measuring instrument

Category:Contact Angle Measuring Instrument

A wafer contact angle detection device specially designed for wafer wafer customers, which can meet the multi-point testing of 6-12 inch wafer samples.


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The fully automatic wafer contact angle measuring instrument SDC-580 is a set of wafer contact angle detection equipment specially designed for wafer wafer customers, which can simultaneously meet the multi-point testing of 6-12 inch wafer samples.


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Copyright © 2024 Dongguan SINDIN Precision instrument Co., Ltd. | 粤ICP备13017174号
Copyright © 2024 Dongguan SINDIN Precision instrument Co., Ltd. | 粤ICP备13017174号 |
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